We design three contest problems covering three distinct areas: design verification, logic synthesis, and design for manufacturing (DFM). Each problem is handled independently. Contestants can participate in one or more problems.

  1. Identical Fault Search
    Tangent Wei and Luke Lin, Synopsys Taiwan Co., Ltd., Taiwan

  2. NP3: Non-exact Projective NPNP Boolean Matching
    Chi-An (Rocky) Wu and Chih-Jen (Jacky) Hsu, Cadence Design Systems Inc., Taiwan

  3. Pattern Classification for Integrated Circuit Design Space Analysis
    Rasit O. Topaloglu, IBM Corp., USA